New article in Advanced Materials Technology

A new approach to in-plane surface plasmon polariton detection is demonstrated in a new article in Advanced Materials Technology by Dr Eugene Panchenko, other members of the group and collaborators at Tel Aviv University. The design is based on metal–semiconductor–metal photodetectors that are acknowledged as having one of the best speed characteristics among photodetectors. The technique has the potential to enable the integration of surface plasmons as signal carriers in future high-speed optoelectronic integrated circuits. More information here.